() () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () () 1149.1 (1) 2021 () 4bit up counter (1) 7 segment decoder (1) ACE (1) AHB (1) AI (1) AI accelorator (1) AMBA (1) AOCV () APB (1) ARM (1) ASIC (15) ASIC Verification engineer (1) ASSP (4) ATPG (2) AXI (1) Accelerated (1) Advanced (1) Aging () Analysis () Architecture () Assembly Machine language (1) BA (2) Bathtub (1) Blockchain (1) Boundary (1) Burn-in (1) Bus (1) C (1) CDC (2) CHI (1) CISC (1) CMOS (2) CMOS (2) CRPR (1) CTS (1) CV (5) Cache () Capacitance (1) Car engine starter altenator (1) Change (1) Characteristics (1) Chip (1) ChipDesign (1) Chiplet (1) Circuit (1) Circuits (1) Circuits (1) Clock (4) Clock divider (1) Closure (1) Closure (1) Communication (1) Communication (1) Compiler (1) Computer (3) Computer architecture (1) Computer arcitecture (1) Constraint (1) Consumption (5) Controller () Corner (1) Critical (1) Crosstalk () Current () Curve () Cycle () D-Algorithm (1) DAT (1) DC (1) DDR (1) DDRRAM (1) DEF (1) DFM (1) DFM (1) DFT (6) DFT (6) DFT compiler (1) DK (1) DLL () DRAM () DRC (1) DRT (1) Data (2) Debugging () Defect (2) Delay () Design (8) Design (8) Design Compiler (1) Design Kit (1) Design compiler (1) Detection () Die () Digital (9) DigitalDesign (2) Distribution (1) Drop () Duty (1) Dynamic (1) ECO () EDA (2) EEPROM (1) EPROM (1) ESD () Element (1) Engineering (1) Error (1) FLOW (1) FPGA (5) Fabless (1) Failure (1) Fanout (1) Fault (1) FeRAM (1) FinFET () Flip-flop () Foundry () Gating () Generation () Googling tip (1) Guard (1) HCI () HDD (1) HDL (3) HEV PHEV EV (1) HPC (1) Hierarchy () High-Speed (1) IC (7) IDDQ (1) IEEE (1) IR (1) ISO262262 Electric car PHEV (1) Infant (1) Integrated (1) Integrity (3) Integrity (3) Interconnect (2) Interconnect (2) Interface () Interpreter (1) Isolation (1) JTAG () Jitter () LEF (1) Language (1) Latch-up () Latchup () Law (1) Layout () Leakage (2) Leakage (2) Lint (1) Logic () Low (1) Low Power (2) Lowpower (1) MBIST (1) MBIST. Multibit (2) MMMC () MOSFET (2) MRAM (1) MTBF () MTTF (1) Management (1) Management (1) Manufacturability () Manufacturing (2) Manufacturing (2) Memory (4) Memory sccess (1) Metastability () Microelectronics (1) Modification () Moore (1) Moore's (1) Mortality () Multi-Corner () Multi-Mode (1) NAND (1) NBA (2) NBTI () NMOS () NOR (1) NPU (1) NoC () Node () OCV (2) OCV (2) On-Chip (4) Optimization (1) Optimization (1) Order () PDK (1) PI (1) PIM (1) PLL () PMOS () POCV () PODEM (1) PRAM (1) PROM (1) PVT (2) Parallel (1) Parametric (1) Path () Performance (1) Physical (1) PhysicalDesign (3) PoRAM (1) Power (6) Power (6) PrimeTime (1) Primetime (1) Process (1) Processing (2) Programmable (1) Python (1) Quiescent (1) RAM (1) RDC (1) RISC (1) RISC-V (1) ROM (1) RTL (3) Rate () ReRAM (1) Reliability (2) Reliability (2) Ring () SDF (1) SEDEX (1) SEMICONDUCTOR (1) SEMIFIVE (1) SIFIVE (1) SPEF (1) SRAM (1) SSD (1) STA (3) STDCELL (1) Scan () Searching skill (1) Semiconductor (6) Semiconductor Process (1) Sequential (1) SerDes () Signal (7) Silicon (1) Skew () Slew (1) SoC (7) SoC (7) Static (10) Stress (1) Subthreshold (1) Synchronous (1) Synopsys (2) Synthesis (1) System (1) TCL (1) TNS () Tape-out () Technology (1) Test (1) Test (1) TestMAX (1) Testability (1) Testing (1) Testing (1) TetraMAX (1) Threshold (3) Timing (13) Transistor (2) Transition (1) Transmission () UFS (1) UPF (1) VLSI (16) VLSI (16) Validation (1) Variation () Variations () Verification (2) Verilog (5) Verilog RTL (1) VerilogHDL (2) Voltage (2) Voltage (2) WNS () Wafer (1) Wafer (1) Wire (1) Yield (1) bitcoin (1) cloud computing (2) computer science (1) design (1) eMMC (1) edge computing (2) extension (2) for (1) grid computing (2) low (1) memory (1) memorycompiler (1) metastable sate (1) power (1) process (1) verilog coding style (1) vi editor (1) vlsi (1) 半导体 (5) 精细工程 (2) 计算机结构 (1) 꿀팁 (1) 나노공정 (2) 디지털 논리 회로 (1) 디지털논리회로 (1) 머신러닝 (1) 무어의법칙 (2) 미세공정 (2) 반도체 (1) 반도체대전 (1) 병럴처리 (1) 병렬 컴퓨팅 (1) 삼성 공장 (1) 삼성 생산 기지 (1) 삼성전자 (1) 설계 (1) 저전력 (2)